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Temperature and excitation density dependent photoluminescence of sputtering-induced GaAs/AlGaAs quantum dots

Y Wang1, S F Yoon, C Y Liu, C Y Ngo and J Ahn

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GaAs/AlGaAs quantum dots (QDs) are fabricated by low-energy ion beam sputtering and molecular beam epitaxy (MBE) re-growth. Temperature (6.5–78 K) and excitation power density (0.49–3.06 W cm−2) dependent photoluminescence (PL) are presented and discussed in detail. The low-temperature PL emission at 720 nm is attributed to GaAs QDs with height of ~6.1 nm and base width of ~23 nm, calculated based on the quantum box model with infinite potential barrier. The calculated QD dimensions are in good agreement with those obtained from atomic force microscopy (AFM) analysis. Nonradiative recombination and Auger-assisted recombination are found to be the main PL quenching mechanisms at high temperature.


PACS

78.67.Hc Quantum dots

78.55.Cr III-V semiconductors

81.07.Ta Quantum dots

81.15.Hi Molecular, atomic, ion, and chemical beam epitaxy

81.16.-c Methods of nanofabrication and processing

81.15.Cd Deposition by sputtering

Subjects

Condensed matter: electrical, magnetic and optical

Semiconductors

Surfaces, interfaces and thin films

Nanoscale science and low-D systems

Dates

Issue 1 (9 January 2008)

Received 8 September 2007, in final form 18 October 2007

Published 29 November 2007



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