A S Walton et al 2007 Nanotechnology 18 065204 doi:10.1088/0957-4484/18/6/065204
A S Walton1, C S Allen1, K Critchley1, M Ł Górzny1, J E McKendry1, R M D Brydson2, B J Hickey1 and S D Evans1,3
Show affiliationsThis work presents nanoscale four-probe measurements on metallic nanowires using independently controlled scanning tunnelling microscope tips. This technique has allowed us to follow the change in resistance with probe separation. Gold, zinc and nickel nanowires were grown by electrodeposition within porous polycarbonate membranes. Their structure and composition were studied by transmission electron microscopy. Four-probe electrical transport measurements were taken using four independently controlled scanning tunnelling microscope tips positioned using a high resolution scanning electron microscope. Multiple I–V measurements were taken at varying tip separations, on each nanowire, and the change in resistance with separation was observed to be in good agreement with predictions based on the nanowire geometry. The resistivity values of the nanowires were found to be close to bulk values.
73.63.-b Electronic transport in nanoscale materials and structures
Issue 6 (14 February 2007)
Received 26 October 2006, in final form 1 December 2006
Published 10 January 2007
A S Walton et al 2007 Nanotechnology 18 065204
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