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Controlled selective growth of ZnO nanorod arrays and their field emission properties

Q Ahsanulhaq, Jin-Hwan Kim and Yoon-Bong Hahn1

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Controlled, ordered arrays of ZnO nanorods having a high aspect ratio of ~30:1 and diameter of ~50 nm were fabricated on silicon substrates by combining electron-beam lithography and simple solution growth techniques. This top-down and bottom-up hybrid approach resulted in excellent control of periodicity, location, and density of ZnO nanorod arrays on silicon substrates. The field emission measurements from the as-grown ZnO nanorod arrays showed a low turn-on field of ~2.85 V µm−1 and a high field-enhancement factor (β) of ~1.68 × 103.


PACS

81.16.Nd Nanolithography

68.37.Hk Scanning electron microscopy (SEM) (including EBIC)

61.46.-w Structure of nanoscale materials

79.70.+q Field emission, ionization, evaporation, and desorption

78.67.-n Optical properties of low-dimensional, mesoscopic, and nanoscale materials and structures

78.55.Et II-VI semiconductors

Subjects

Condensed matter: electrical, magnetic and optical

Semiconductors

Surfaces, interfaces and thin films

Nanoscale science and low-D systems

Dates

Issue 48 (5 December 2007)

Received 3 September 2007, in final form 7 October 2007

Published 1 November 2007



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