Brian J Rodriguez et al 2007 Nanotechnology 18 475504 doi:10.1088/0957-4484/18/47/475504
Brian J Rodriguez1,2, Clint Callahan3, Sergei V Kalinin1,2,4 and Roger Proksch3,4
Show affiliationsA dual-excitation method for resonant-frequency tracking in scanning probe microscopy based on amplitude detection is developed. This method allows the cantilever to be operated at or near resonance for techniques where standard phase locked loops are not possible. This includes techniques with non-acoustic driving where the phase of the driving force is frequency and/or position dependent. An example of the latter is piezoresponse force microscopy (PFM), where the resonant frequency of the cantilever is strongly dependent on the contact stiffness of the tip–surface junction and the local mechanical properties, but the spatial variability of the drive phase rules out the use of a phase locked loop. Combined with high-voltage switching and imaging, dual-frequency, resonance-tracking PFM allows reliable studies of electromechanical and elastic properties and polarization dynamics in a broad range of inorganic and biological systems, and is illustrated using lead zirconate–titanate, rat tail collagen, and native and switched ferroelectric domains in lithium niobate.
Issue 47 (28 November 2007)
Received 2 August 2007, in final form 24 September 2007
Published 19 October 2007
Brian J Rodriguez et al 2007 Nanotechnology 18 475504
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L Lee et al 2008 J. Phys.: Conf. Ser. 125 012077
Jian You et al 2008 Nanotechnology 19 255103
R Ang et al 2009 J. Phys. D: Appl. Phys. 42 225104
F Aguilera-Granja et al 2007 Nanotechnology 18 365706
Nam-Goo Cha et al 2009 Nanotechnology 20 395301
G Wilde et al 2009 J. Phys.: Condens. Matter 21 464113