D L Sales et al 2007 Nanotechnology 18 475503 doi:10.1088/0957-4484/18/47/475503
Critical strain region evaluation of self-assembled semiconductor quantum dots
FREE ISSUED L Sales1, J Pizarro2, P L Galindo2, R Garcia1, G Trevisi3, P Frigeri3, L Nasi3, S Franchi3 and S I Molina1
Show affiliationsA novel peak finding method to map the strain from high resolution transmission electron micrographs, known as the Peak Pairs method, has been applied to In(Ga)As/AlGaAs quantum dot (QD) samples, which present stacking faults emerging from the QD edges. Moreover, strain distribution has been simulated by the finite element method applying the elastic theory on a 3D QD model. The agreement existing between determined and simulated strain values reveals that these techniques are consistent enough to qualitatively characterize the strain distribution of nanostructured materials. The correct application of both methods allows the localization of critical strain zones in semiconductor QDs, predicting the nucleation of defects, and being a very useful tool for the design of semiconductor devices.
- PACS
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68.65.Hb Quantum dots (patterned in quantum wells)
81.40.Jj Elasticity and anelasticity, stress-strain relations
61.72.Nn Stacking faults and other planar or extended defects
- Subjects
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Surfaces, interfaces and thin films
- Dates
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Issue 47 (28 November 2007)
Received 23 April 2007, in final form 24 September 2007
Published 19 October 2007
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Critical strain region evaluation of self-assembled semiconductor quantum dots
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