Peter M Albrecht and Joseph W Lyding 2007 Nanotechnology 18 125302 doi:10.1088/0957-4484/18/12/125302
Peter M Albrecht and Joseph W Lyding
Show affiliationsAn ultrahigh vacuum scanning tunnelling microscope (UHV-STM) was used to modify the interface between isolated ≈10 Å-diameter single-walled carbon nanotubes (SWNTs) and the hydrogen-passivated Si(100) surface. Room-temperature UHV-STM desorption of hydrogen at the SWNT/H-Si(100) interface resulted in the local mechanical stabilization of tubes originally perturbed by the rastered STM tip under nominal imaging conditions. For the section of the SWNT contacted by depassivated Si, a topographic depression of 1.5 Å (1 Å) was measured in the case of parallel (nearly perpendicular) alignment between the tube axis and the Si dimer rows, in agreement with existing first-principles calculations. The compatibility of hydrogen-resist UHV-STM nanolithography with SWNTs adsorbed on H-Si(100) would enable the atomically precise placement of single molecules in proximity to the tube for the bottom-up fabrication of molecular electronic devices.
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
68.35.Ct Interface structure and roughness
68.35.B- Structure of clean surfaces (and surface reconstruction)
Issue 12 (28 March 2007)
Received 8 January 2007, in final form 26 January 2007
Published 21 February 2007
Peter M Albrecht and Joseph W Lyding 2007 Nanotechnology 18 125302
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A S Walton et al 2007 Nanotechnology 18 065204
M Ejrnaes et al 2009 Supercond. Sci. Technol. 22 055006
Charles Weiss 2006 Environ. Res. Lett. 1 014003
Steven Weinstein 2006 Class. Quantum Grav. 23 4231
Selim Esedoglu and Dejan Slepčev 2008 Nonlinearity 21 2759
Bin He et al 2005 Phys. Med. Biol. 50 4169
Bo Thidé 2007 Plasma Phys. Control. Fusion 49 B103