Chang-Duk Kim et al 2006 Nanotechnology 17 5180 doi:10.1088/0957-4484/17/20/023
Chang-Duk Kim1, Hoon-Sik Jang2, Sung-Youp Lee1, Hyeong-Rag Lee1,3, Yong-Suk Roh3, Il-Su Rhee3, Eui-Wan Lee3, Hee-Sun Yang4 and Do-Hyung Kim1,3
Show affiliationsThe current–voltage (I–V) characteristics of carbon nanotubes (CNTs) during field emission were investigated by in situ imaging and field-emission (FE) measurement inside a field-emission scanning electron microscope (FE-SEM). A primary electron of the FE-SEM could induce and enhance a large stimulated electron emission from a CNT which might be due to the strong local field on the tip of the CNT in the presence of an applied voltage. FE of bent nanotubes (BNTs) can initially occur after they are fully straightened or it can start in the bent state (during geometrical straightening) as the applied field increases. The FE from a single CNT follows FN (Fowler–Nordheim) behaviour with a single linear slope in the FN plot. The FE from two nanotubes with a geometrical change during FE showed transition of the FN slope from the low voltage to the high voltage region, which could be due to interactions between two dynamic neighbouring BNTs.
79.70.+q Field emission, ionization, evaporation, and desorption
68.37.Hk Scanning electron microscopy (SEM) (including EBIC)
Condensed matter: electrical, magnetic and optical
Issue 20 (28 October 2006)
Received 21 May 2006, in final form 13 August 2006
Published 28 September 2006
Chang-Duk Kim et al 2006 Nanotechnology 17 5180
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