Ji-Eun Kim et al 2006 Nanotechnology 17 2937 doi:10.1088/0957-4484/17/12/019
Ji-Eun Kim1, June-Ki Park2 and Chang-Soo Han1,3
Show affiliationsWe have developed a method for fabricating a carbon nanotube (CNT) tip for an atomic force microscope (AFM). To attach a CNT to the tip apex, we used dielectrophoresis (DEP) with a non-uniform electric field. After inserting a drop of CNT solution and applying an AC electric field between a metal-coated AFM tip and an electrode plate, CNTs were deposited directly on the tip so that they protruded from the tip. We fabricated tips with individual multi-walled carbon nanotubes and found the experimental conditions that gave high fabrication yields. From AFM measurements of the nanoscale anodized aluminium oxide (AAO) structure, we have shown that a CNT tip assembled using DEP can produce high-resolution images and have a good wear resistance.
82.45.-h Electrochemistry and electrophoresis
68.37.Hk Scanning electron microscopy (SEM) (including EBIC)
Surfaces, interfaces and thin films
Issue 12 (28 June 2006)
Received 20 January 2006, in final form 20 April 2006
Published 30 May 2006
Ji-Eun Kim et al 2006 Nanotechnology 17 2937
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