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Fabrication of GaN nanotubular material using MOCVD with an aluminium oxide membrane

Woo-Gwang Jung1,3, Se-Hyuck Jung1, Patrick Kung2 and Manijeh Razeghi2

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GaN nanotubular material is fabricated with an aluminium oxide membrane in MOCVD. SEM, XRD, TEM and PL are employed to characterize the fabricated GaN nanotubular material. An aluminium oxide membrane with ordered nanoholes is used as a template. Gallium nitride is deposited at the inner wall of the nanoholes in the aluminium oxide template, and the nanotubular material with high aspect ratio is synthesized using the precursors of TMG and ammonia gas. Optimal synthesis conditions in MOCVD are obtained successfully for the gallium nitride nanotubular material in this research. The diameter of the GaN nanotube fabricated is approximately 200–250 nm and the wall thickness is about 40–50 nm. GaN nanotubular material consists of numerous fine GaN particulates with size range 15–30 nm. The composition of gallium nitride is confirmed to be stoichiometrically 1:1 for Ga and N by EDS. XRD and TEM analyses indicate that the grains in GaN nanotubular material have a nano-crystalline structure. No blue shift is found in the PL spectrum on the GaN nanotubular material fabricated in an aluminium oxide template.


PACS

81.07.-b Nanoscale materials and structures: fabrication and characterization

78.55.Cr III-V semiconductors

68.55.-a Thin film structure and morphology

81.15.Gh Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, etc.)

72.80.Ey III-V and II-VI semiconductors

61.46.-w Structure of nanoscale materials

Subjects

Condensed matter: electrical, magnetic and optical

Semiconductors

Surfaces, interfaces and thin films

Nanoscale science and low-D systems

Dates

Issue 1 (14 January 2006)

Received 20 June 2005, in final form 18 August 2005

Published 25 November 2005



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