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Atom tracking for reproducible force spectroscopy at room temperature with non-contact atomic force microscopy

Masayuki Abe1, Yoshiaki Sugimoto, Óscar Custance and Seizo Morita

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A method for reproducible site-specific force spectroscopic measurements at room temperature by combining frequency modulation atomic force microscopy and the atom tracking technique is proposed. The atom tracking enables us to compensate the change in the tip–sample relative position induced by the thermal drift as well as to precisely position the tip over the same spot of the surface within sub-Ångström stability. Here, we describe our atom-tracking implementation and the protocol we have followed for the reproducible room-temperature acquisition of series of frequency shift versus tip–sample distance (Δf–Z) curves using this technique. With this acquisition protocol, a large number of equivalent Δf–Z curves can be averaged, resulting in a considerable noise reduction, and therefore avoiding its propagation to the corresponding calculated force curve.


PACS

68.37.Ps Atomic force microscopy (AFM)

68.47.Fg Semiconductor surfaces

Subjects

Semiconductors

Surfaces, interfaces and thin films

Dates

Issue 12 (December 2005)

Received 23 August 2005, in final form 27 September 2005

Published 28 October 2005



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