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Nanolithography based contacting method for electrical measurements on single template synthesized nanowires

S Fusil1, L Piraux2,4, S Mátéfi-Tempfli2, M Mátéfi-Tempfli2, S Michotte2, C K Saul3,5, L G Pereira3, K Bouzehouane3, V Cros3, C Deranlot3 and J-M George3

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A reliable method enabling electrical measurements on single nanowires prepared by electrodeposition in an alumina template is described. This technique is based on electrically controlled nanoindentation of a thin insulating resist deposited on the top face of the template filled by the nanowires. We show that this method is very flexible, allowing us to electrically address single nanowires of controlled length down to 100 nm and of desired composition. Using this approach, current densities as large as 109 A cm−2 were successfully injected through a point contact on a single magnetic multilayered nanowire. This demonstrates that the technique is very promising for the exploration of electrical spin injection in magnetic nanostructures.


PACS

81.16.Nd Nanolithography

73.63.Rt Nanoscale contacts

75.47.-m Magnetotransport phenomena; materials for magnetotransport

75.75.+a Magnetic properties of nanostructures

75.70.Cn Magnetic properties of interfaces (multilayers, superlattices, heterostructures)

81.07.Lk Nanocontacts

Subjects

Condensed matter: electrical, magnetic and optical

Surfaces, interfaces and thin films

Nanoscale science and low-D systems

Dates

Issue 12 (December 2005)

Received 1 August 2005, in final form 7 September 2005

Published 25 October 2005



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