Nikhil S Tambe and Bharat Bhushan 2005 Nanotechnology 16 2309 doi:10.1088/0957-4484/16/10/054
Nikhil S Tambe and Bharat Bhushan1
Show affiliationsThe velocity dependence of nanoscale friction is studied for the first time over a wide range of velocities between 1 µm s−1 and 10 mm s−1 on large scan lengths of 2 and 25 µm. High sliding velocities are achieved by modifying an existing commercial atomic force microscope (AFM) setup with a custom calibrated nanopositioning piezo stage. The friction and adhesive force dependences on velocity are studied on four different sample surfaces, namely dry (unlubricated), hydrophilic Si(100); dry, partially hydrophobic diamond-like carbon (DLC); a partially hydrophobic self-assembled monolayer (SAM) of hexadecanethiol (HDT); and liquid perfluoropolyether lubricant, Z-15. The friction force values are seen to reverse beyond a certain critical velocity for all the sample surfaces studied. A comprehensive friction model is developed to explain the velocity dependence of nanoscale friction, taking into consideration the contributions of adhesion at the tip–sample interface, high impact velocity-related deformation at the contacting asperities and atomic scale stick–slip. A molecular spring model is used for explaining the velocity dependence of friction force for HDT.
62.25.-g Mechanical properties of nanoscale systems
81.40.Pq Friction, lubrication, and wear
68.37.Ps Atomic force microscopy (AFM)
62.20.F- Deformation and plasticity
Surfaces, interfaces and thin films
Issue 10 (October 2005)
Received 18 May 2005
Published 26 August 2005
Nikhil S Tambe and Bharat Bhushan 2005 Nanotechnology 16 2309
Ghim Wei Ho et al 2004 Nanotechnology 15 996
V Baranauskas et al 2004 Nanotechnology 15 1661
M Pientka et al 2004 Nanotechnology 15 163
Y Liu et al 2004 Nanotechnology 15 1368
Anisa Mnyusiwalla et al 2003 Nanotechnology 14 R9
Philip Ball 2002 Nanotechnology 13 R15
R S Davis 1995 Meas. Sci. Technol. 6 227
Songxue Chi et al 2011 Meas. Sci. Technol. 22 047001
D J McCarron et al 2008 Meas. Sci. Technol. 19 105601