Junji Tominaga et al 2004 Nanotechnology 15 411 doi:10.1088/0957-4484/15/5/001
Ferroelectric catastrophe: beyond nanometre-scale optical resolution
Junji Tominaga, Takayuki Shima, Masashi Kuwahara, Toshio Fukaya, Alexander Kolobov and Takashi Nakano
Show affiliationsThe optical diffraction limit is rigidly determined as a simple equation of wavelength λ and lens numerical aperture NA (
): λ/2/NA. In this paper, we report that Ag5.8In4.4Sb61.0Te28.8 and Ge2Sb2Te5 chalcogenide thin films, which are typical of optical recording materials used in digital versatile discs (DVDs), enable a resolution of under λ/10 due to their ferroelectric properties. In the Ag5.8In4.4Sb61.0Te28.8 film it was found that this optical super-resolution can be observed between 350 and 400 °C, resulting in a second phase transition from a hexagonal (A7 belonging to 
) to a rhombohedral structure of R32 or R3m. In Ge2Sb2Te5, on the other hand, the temperature range is much wider, between 250 and 450 °C, which is also due to a second phase transition from a NaCl-type fcc to a hexagonal structure.
- PACS
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42.70.Ln Holographic recording materials; optical storage media
77.84.Bw Elements, oxides, nitrides, borides, carbides, chalcogenides, etc.
77.55.+f Dielectric thin films
- Subjects
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Condensed matter: electrical, magnetic and optical
- Dates
-
Issue 5 (May 2004)
Received 15 August 2003, in final form 25 November 2003
Published 29 January 2004
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Ferroelectric catastrophe: beyond nanometre-scale optical resolution
Junji Tominaga et al 2004 Nanotechnology 15 411
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