C Gómez-Navarro et al 2003 Nanotechnology 14 134 doi:10.1088/0957-4484/14/2/306
Probing electrical transport in nanowires: current maps of individual V2O5 nanofibres with scanning force microscopy
C Gómez-Navarro1, P J de Pablo1,3, J Colchero1, Y Fan2, M Burghard2, J Gómez-Herrero1,4 and A M Baró1
Show affiliationsIn this work we present two scanning force microscopy (SFM) techniques applied to the electrical characterization of V2O5 nanofibres with one end connected to a metallic electrode: first a non-contact imaging technique combined with the acquisition of current versus voltage curves in a selected spot, and second jumping mode SFM that allows simultaneous acquisition of topograhic images and current maps with nanometric resolution.
Both the conductivity (~20 S cm−1) and the contact resistance (~ 62 MΩ) of the fibres are determined. A non-linear behaviour of the conductivity is observed for large applied electrical fields (
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Issue 2 (February 2003)
Received 12 September 2002, in final form 6 November 2002
Published 10 January 2003
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Probing electrical transport in nanowires: current maps of individual V2O5 nanofibres with scanning force microscopy
C Gómez-Navarro et al 2003 Nanotechnology 14 134
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