James B Thompson et al 2001 Nanotechnology 12 394 doi:10.1088/0957-4484/12/3/331
James B Thompson, Barney Drake, Johannes H Kindt, Jessica Hoskins and Paul K Hansma
Show affiliationsWe present a method for assessing an atomic force microscope's (AFM's) ability to reject externally applied vibrations. This method is demonstrated on one commercial and two prototype AFMs. For optimally functioning AFMs, we find that the response to externally applied vibrations obeys a 1/ω2 frequency dependence. This 1/ω2 frequency dependence can be understood by modelling the mechanical system which connects the AFM cantilever and the sample under test as a simple harmonic oscillator. According to such a model, the resonant frequency of the mechanical system which connects the AFM cantilever and the sample under test determines an AFM's ability to reject externally applied, low-frequency vibrations.
68.37.Ps Atomic force microscopy (AFM)
Issue 3 (September 2001)
Received 8 June 2001, in final form 3 August 2001
Published 28 August 2001
James B Thompson et al 2001 Nanotechnology 12 394
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