Anil Gannepalli and Surya K Mallapragada 2001 Nanotechnology 12 250 doi:10.1088/0957-4484/12/3/309
Anil Gannepalli and Surya K Mallapragada1
Show affiliationsMolecular dynamics studies are performed to investigate the evolution of the deformed region during nanoindentation of silicon. A new approach based on a local strain diagnostic to identify and characterize the plastic rearrangements occurring during indentation is presented. During indentation, the response of the substrate changes from elastic to plastic to relieve the accumulated stress. The plastic rearrangements involve the displacement of atoms from the lattice sites to interstitial sites. The formation of interstitials results in the transformation of the deformed region to a denser amorphous phase. During retraction of the tip, the deformed region undergoes an incomplete elastic recovery signifying the plastic nature of rearrangements.
61.43.Bn Structural modeling: serial-addition models, computer simulation
62.20.F- Deformation and plasticity
81.40.Np Fatigue, corrosion fatigue, embrittlement, cracking, fracture, and failure
Issue 3 (September 2001)
Received 20 October 2000, in final form 22 January 2001
Published 24 August 2001
Anil Gannepalli and Surya K Mallapragada 2001 Nanotechnology 12 250
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