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Noise in MEMS

FEATURED ARTICLE REVIEW ARTICLE

F Mohd-Yasin1, D J Nagel2 and C E Korman2

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TOPICAL REVIEW

This review provides a comprehensive survey of noise research in MEMS. Some background on noise and on MEMS is provided. We review noise production mechanisms, and highlight work on the theory and modeling of noise in MEMS. Then noise measurements in the specific types of MEMS are reviewed. Inertial MEMS (accelerometers and angular rate sensors), pressure and acoustic sensors, optical MEMS, RF MEMS, surface acoustic wave devices, flow sensors, and chemical and biological MEMS, as well as data storage devices and magnetic MEMS, are reviewed. We indicate opportunities for additional experimental and computational research on noise in MEMS.


PACS

85.85.+j Micro- and nano-electromechanical systems (MEMS/NEMS) and devices

07.10.Cm Micromechanical devices and systems

07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

Subjects

Electronics and devices

Instrumentation and measurement

Nanoscale science and low-D systems

Dates

Issue 1 (January 2010)

Received 6 August 2007, in final form 6 July 2009

Published 6 November 2009



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