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Measurement of air-refractive-index fluctuation from frequency change using a phase modulation homodyne interferometer and an external cavity laser diode

Masashi Ishige, Masato Aketagawa1, Tuan Banh Quoc and Yuta Hoshino

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We present a method for air-refractive-index (nair) fluctuation measurement using a laser interferometer. The method is based on a combination of a phase modulation homodyne interferometer (PMHI), an external cavity laser diode (ECLD) and an ultralow thermal expansion material (ULTEM). The PMHI utilizes a Michelson interferometer which is constructed on the ULTEM plate under the condition of an air temperature fluctuation of less than 10 mK, so that the optical path change or the air-refractive-index fluctuation (Δnair) caused by the thermal disturbance can be neglected. Meanwhile, the ECLD is controlled by adjusting its frequency to track some of the dark fringes of the interferometer, so that Δnair can be derived from the ECLD frequency change. The uncertainty of the Δnair measurement in the experiment is of 10−8 order. However, it will be possible to decrease the uncertainty to 10−9 or less if the signal-to-noise ratio (SNR) of the control system is improved.


PACS

07.60.Hv Refractometers and reflectometers

42.55.Px Semiconductor lasers; laser diodes

07.60.Ly Interferometers

42.60.Fc Modulation, tuning, and mode locking

Subjects

Instrumentation and measurement

Optics, quantum optics and lasers

Dates

Issue 8 (August 2009)

Received 27 November 2008, in final form 24 March 2009

Published 30 June 2009



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