Sin Kim et al 2009 Meas. Sci. Technol. 20 125404 doi:10.1088/0957-0233/20/12/125404
Sin Kim1, Jeong Seong Lee1, Kyung Youn Kim2, Kyung Ho Kang3 and Byung Jo Yun3
Show affiliationsA capacitance method is applied to measure the space-averaged void fraction in concentric annular flows. From the analytical solution of the governing electrical field equations, the expression for the capacitance in terms of a given void fraction is derived. Also, a closed form formula to predict the void fraction from the capacitance measurement is proposed. The relationship between the capacitance and the void fraction is successfully compared with static phantom experiments.
Issue 12 (December 2009)
Received 21 July 2009, in final form 15 October 2009
Published 6 November 2009
Sin Kim et al 2009 Meas. Sci. Technol. 20 125404
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