Wendy Van Moer et al 2009 Meas. Sci. Technol. 20 125104 doi:10.1088/0957-0233/20/12/125104
Wendy Van Moer, Rik Pintelon and Yves Rolain
Show affiliationsThis paper presents a method to measure the nonlinear distortions generated by a device-under-test (DUT) out of the frequency band where the device operates. The method compensates for the nonlinear distortions present in the input signal of the DUT and, hence, results in a source-pull free level of the output nonlinear distortions. This is important when determining an accurate adjacent co-channel power ratio (ACPR). The proposed measurement technique is based on a vectorial network analyzer (PNA-X) combined with a broadband multisine excitation of the DUT. Results obtained from a microwave amplifier are reported.
07.57.-c Infrared, submillimeter wave, microwave and radiowave instruments and equipment
84.40.Ua Telecommunications: signal transmission and processing; communication satellites
Issue 12 (December 2009)
Received 2 July 2009, in final form 5 October 2009
Published 6 November 2009
Wendy Van Moer et al 2009 Meas. Sci. Technol. 20 125104
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