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Measuring source-pull free nonlinear distortions: a multisine approach

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Wendy Van Moer, Rik Pintelon and Yves Rolain

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This paper presents a method to measure the nonlinear distortions generated by a device-under-test (DUT) out of the frequency band where the device operates. The method compensates for the nonlinear distortions present in the input signal of the DUT and, hence, results in a source-pull free level of the output nonlinear distortions. This is important when determining an accurate adjacent co-channel power ratio (ACPR). The proposed measurement technique is based on a vectorial network analyzer (PNA-X) combined with a broadband multisine excitation of the DUT. Results obtained from a microwave amplifier are reported.


PACS

07.57.-c Infrared, submillimeter wave, microwave and radiowave instruments and equipment

84.40.Ua Telecommunications: signal transmission and processing; communication satellites

84.30.Le Amplifiers

Subjects

Electronics and devices

Instrumentation and measurement

Dates

Issue 12 (December 2009)

Received 2 July 2009, in final form 5 October 2009

Published 6 November 2009



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