F Z Fang et al 2008 Meas. Sci. Technol. 19 055501 doi:10.1088/0957-0233/19/5/055501
F Z Fang1,2, Z W Xu1,2 and S Dong3
Show affiliationsThe attractive and repulsive interaction forces between a probe and a sample in atomic force microscopy (AFM) can be distinguished from the probe's phase angle images. By changing the AFM scan parameters, the probe's phase angle is found to be very sensitive to the properties of adhesion and viscoelasticity of the materials to be analyzed. The tapping probe is found to suffer great repulsive forces at the right edge of gratings, which is mainly due to the probe having a cantilever tilt angle of 11°. A single carbon nanotube (CNT) made by the chemical vapor method is found to be hydrophobic from the phase angle image of a carbon nanotube probe. The CNT probe shows better phase image resolution over the Si probe in AFM scanning immunoglobulin G proteins. The study of probe phase angles reveals that the image artifacts captured by CNT probes at grating edges result from the repeated CNT bending–adhesion–separation process.
81.16.Be Chemical synthesis methods
68.37.Ps Atomic force microscopy (AFM)
62.40.+i Anelasticity, internal friction, stress relaxation, and mechanical resonances
Surfaces, interfaces and thin films
Issue 5 (May 2008)
Received 17 September 2007, in final form 15 February 2008
Published 2 April 2008
F Z Fang et al 2008 Meas. Sci. Technol. 19 055501
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