B S Hoyle and X Jia 2004 Meas. Sci. Technol. 15 1355 doi:10.1088/0957-0233/15/7/019
B S Hoyle1 and X Jia2
Show affiliationsThe paper introduces a novel enabling step toward the widespread exploitation of the multi-dimensional process sensing offered by process tomography (PT) technology that has demonstrated a unique insight into many processes. Most current applications are laboratory or pilot-plant based. Generic system integration tools are proposed that deal systematically with PT data to accelerate the assessment and application of PT sensing, and hence deliver the large benefits expected to arise from large-scale exploitation of multi-dimensional sensing. Where multi-dimensional PT sensor data are available, a suite of enabling tools, reality visualization modelling (RVM), are proposed as the complementary generic set of processing methods needed to take internal process state data and yield directly usable process information, either for design model confirmation or for effective plant control, or monitoring. A further step: generic-RVM (GRVM) extends this concept through a generically defined process topology, complete with method and model set, to expedite mass-market application. The paper offers a practical illustration through a small pilot trial.
07.07.Df Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing
47.80.-v Instrumentation and measurement methods in fluid dynamics
Issue 7 (July 2004)
Received 15 December 2003, in final form 15 April 2004
Published 16 June 2004
B S Hoyle and X Jia 2004 Meas. Sci. Technol. 15 1355
S B Belmonte et al 2003 Meas. Sci. Technol. 14 N1
Sangon Park et al 2002 Meas. Sci. Technol. 13 859
Hequan Sun 2002 Meas. Sci. Technol. 13 1996
R Devonshire et al 2000 Meas. Sci. Technol. 11 547
C C Speake and T J Quinn 1999 Meas. Sci. Technol. 10
Jürgen Blum et al 1999 Meas. Sci. Technol. 10 836
A P Garyaka et al 2008 J. Phys. G: Nucl. Part. Phys. 35 115201
Ralf Rapp 2007 J. Phys. G: Nucl. Part. Phys. 34 S405
NA57 Collaboration et al 2007 J. Phys. G: Nucl. Part. Phys. 34 403