J Larsson 2001 Meas. Sci. Technol. 12 1835 doi:10.1088/0957-0233/12/11/311
J Larsson
Show affiliationsRecent developments have allowed x-ray diffraction techniques at synchrotron radiation facilities to be employed with a temporal resolution of around 1 ps. These developments are the availability of firstly, high brightness third-generation x-ray sources, secondly, passively mode-locked lasers with 100 fs temporal duration and thirdly, averaging streak cameras with sub-picosecond temporal resolution. In this paper, we discuss how these novel devices are combined in time-resolved x-ray diffraction experiments at synchrotron radiation facilities.
07.68.+m Photography, photographic instruments; xerography
Accelerators, beams and electromagnetism
Issue 11 (November 2001)
Received 2 March 2001, accepted for publication 2 July 2001, in final form 15 June 2001
Published 9 October 2001
J Larsson 2001 Meas. Sci. Technol. 12 1835
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