J Raju et al 1990 Meas. Sci. Technol. 1 903 doi:10.1088/0957-0233/1/9/012
J Raju, S Ghosh, A Saxena and K K Dwivedi
Show affiliationsThe response of sensitive detectors, CR-39 and ZnP-glass, for 350 MeV 90Zr ions, has been studied. Bulk and track-etch parameters have been evaluated by successive etching. Calibration of the two detectors has been done by correlating the measured track-etch rate (VT) with the residual range and total energy-loss rate. A linear correlation has been observed in both cases. Track registration threshold values of 4.45 MeV mg-1 cm2 for CR-39 and 12.50 MeV mg-1 cm2 for ZnP-glass have been obtained.
06.20.fb Standards and calibration
29.40.Wk Solid-state detectors
Accelerators, beams and electromagnetism
Instrumentation and measurement
Issue 9 (September 1990)
J Raju et al 1990 Meas. Sci. Technol. 1 903
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