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Application of a near coincidence site lattice theory to the orientations of grains on (001)

Lei Shi-+, Jie Gao-+, Guien Zhou-+ and Yuheng Zhang-+,++

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Various orientations of grains in polycrystalline films prepared on (001) substrates by the d.c. sputtering method were studied by x-ray diffraction experiments. The relation between the a and b axes of the thin film and the in-plane lattice vectors of the substrate has been directly obtained by an x-ray reflection scan. The orientational relations agree well with the predication of a simplified theory of a near-coincidence site lattice between and . The grains were found to have a high probability of forming low-angle or low- boundaries among themselves. These grain boundaries are of low energy, free from extraneous phases, and exhibit a high connectivity of Mn - O - Mn nets. Therefore, the boundaries can still support the GMR effect.


PACS

68.55.-a Thin film structure and morphology

61.05.cm X-ray reflectometry (surfaces, interfaces, films)

81.15.Cd Deposition by sputtering

73.50.Jt Galvanomagnetic and other magnetotransport effects (including thermomagnetic effects)

61.05.cp X-ray diffraction

68.55.Ln Defects and impurities: doping, implantation, distribution, concentration, etc.

Subjects

Surfaces, interfaces and thin films

Dates

Issue 37 (15 September 1997)

Received 18 March 1997, in final form 28 May 1997



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