Scaling of the resistance in the two-dimensional Anderson tight-binding model for disordered systems

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, , Citation I Dasgupta et al 1992 J. Phys.: Condens. Matter 4 7865 DOI 10.1088/0953-8984/4/39/002

0953-8984/4/39/7865

Abstract

The authors combine the ideas of real-space renormalization and the vector recursion technique for multilead scattering to study the scaling of resistance with size for a disordered square lattice. They obtain an indication of predominant power-law dependence of the logarithm of the averaged resistance with size in the intermediate disordered regime, which smoothly changes to logarithmic behaviour as the disorder goes to zero.

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10.1088/0953-8984/4/39/002