M S Altman 2010 J. Phys.: Condens. Matter 22 084017 doi:10.1088/0953-8984/22/8/084017
Trends in low energy electron microscopy
M S Altman
Show affiliationsLow energy electron microscopy (LEEM) and spin polarized LEEM (SPLEEM) are two powerful in situ techniques for the study of surfaces, thin films and other surface-supported nanostructures. Their real-time imaging and complementary diffraction capabilities allow the study of structure, morphology, magnetism and dynamic processes with high spatial and temporal resolution. Progress in methods, instrumentation and understanding of novel contrast mechanisms that derive from the wave nature and spin degree of freedom of the electron continue to advance applications of LEEM and SPLEEM in these areas and beyond. We review here the basic imaging principles and recent developments that demonstrate the current capabilities of these techniques and suggest potential future directions.
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- PACS
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68.37.Nq Low energy electron microscopy (LEEM)
- Subjects
- Dates
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Issue 8 (3 March 2010)
Received 12 April 2009
Published 5 February 2010
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Trends in low energy electron microscopy
M S Altman 2010 J. Phys.: Condens. Matter 22 084017
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