We measure systematically the intrinsic scaling behavior of dynamic hysteresis for Pb_0.9Ba_0.1(Zr_0.52Ti_0.48)O₃ (PBZT) ferroelectric thin films with Pt electrodes on Si substrates, utilizing the Sawyer–Tower technique. For the as-prepared thin films of similar thickness and microstructure, over the low frequency range, the scaling follows the power law under low E₀ and the power law under high E₀, where A is the hysteresis area, and f and E₀ are the frequency and amplitude of the external electric field. In the high- f range, the power law for low E₀ takes the form of , while that for high E₀ takes the form of . It is identified that the dynamic behaviors at low frequency mainly come from the intrinsic domain reversal instead of others like the leakage current, while the depolarization field may influence the frequency exponents at high frequency. We study the temperature scaling of the hysteresis, indicating that the scaling under low E₀ is roughly consistent with the (Φ²)² model. Finally, we argue that experimentally obtained power law scaling for Pb(Zr_0.52Ti_0.48)O₃ thin films prepared under the given conditions may not be reliable due to the polarization fatigue effect.