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Local secondary-electron emission spectra of graphite and gold surfaces obtained using the Scanning Probe Energy Loss Spectrometer (SPELS)

J J Lawton, A Pulisciano and R E Palmer

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Secondary-electron emission (SEE) spectra have been obtained with the Scanning Probe Energy Loss Spectrometer at a tip–sample distance of only 50 nm. Such short working distances are required for the best theoretical spatial resolution (<10 nm). The SEE spectra of graphite, obtained as a function of tip bias voltage, are shown to correspond to unoccupied states in the electronic band structure. The SEE spectra of thin gold films demonstrate the capability of identifying (carbonaceous) surface contamination with this technique.


PACS

79.20.Hx Electron impact: secondary emission

73.20.At Surface states, band structure, electron density of states

81.05.Uw Carbon, diamond, graphite

68.49.Jk Electron scattering from surfaces

Subjects

Condensed matter: electrical, magnetic and optical

Surfaces, interfaces and thin films

Condensed matter: structural, mechanical & thermal

Dates

Issue 47 (25 November 2009)

Received 16 March 2009, in final form 27 May 2009

Published 5 November 2009



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