A Locatelli and E Bauer 2008 J. Phys.: Condens. Matter 20 093002 doi:10.1088/0953-8984/20/9/093002
Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM
REVIEW ARTICLEA Locatelli1 and E Bauer2
Show affiliationsTOPICAL REVIEW
Synchrotron-based photoemission electron microscopy (XPEEM) is one of the most powerful spectro-microscopic techniques for the investigation of surfaces, interfaces, thin films and buried layers. By exploiting the tunability and polarizability of x-ray sources as well as progress in electron optics design, modern XPEEM instruments can perform several x-ray spectroscopic investigations with a lateral resolution of a few tens of nanometres. We review here the latest developments in XPEEM, illustrating the state of the art capabilities of the technique. The usefulness of chemical and magnetic imaging XPEEM methods is demonstrated by examples of fundamental and applied studies in surface and material sciences, as well as other fields of application ranging from magnetism to biology and geology.
- PACS
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68.37.Xy Scanning Auger microscopy, photoelectron microscopy
- Subjects
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Condensed matter: electrical, magnetic and optical
- Dates
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Issue 9 (5 March 2008)
Received 4 October 2007, in final form 2 December 2007
Published 15 February 2008
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Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM
A Locatelli and E Bauer 2008 J. Phys.: Condens. Matter 20 093002
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Determination of bulk diffusion length in thin semiconductor layers by SEM-EBIC
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Correlation of magnetism and structure for ultra thin Au/Co/Au films: Evidence for magnetoelastic effects
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Ladder proof of nonlocality for two spin-half particles revisited
José L Cereceda 2002 J. Phys. A: Math. Gen. 35 9105
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