P Murugavel et al 2008 J. Phys.: Condens. Matter 20 415208 doi:10.1088/0953-8984/20/41/415208
P Murugavel1, J-H Lee2, J Y Jo2, Hye Yeong Sim2, J-S Chung3, Younghun Jo4 and Myung-Hwa Jung4
Show affiliationsWe fabricated epitaxial (1−x)BiFeO3–xBaTiO3 (x = 0.1–0.7) solid solution films on niobium doped SrTiO3(001) substrate. The x-ray diffraction analysis of the films indicates compressively strained growth for the composition x<0.3 and strain relaxed growth for the composition x≥0.3. Correspondingly, the films showed a structural change from a rhombohedral (or modified monoclinic MA) phase to a tetragonal phase near the composition x~0.3. Interestingly the ferroelectric measurements showed a distinct difference between the compositions, with the boundary at x~0.3, above which the films remain in a highly resistive state. The magnetic measurements revealed a weak ferromagnetic signature for the films of composition x≤0.5.
68.55.-a Thin film structure and morphology
68.55.Nq Composition and phase identification
75.60.Ej Magnetization curves, hysteresis, Barkhausen and related effects
68.55.A- Nucleation and growth
Issue 41 (15 October 2008)
Received 11 December 2007, in final form 2 August 2008
Published 12 September 2008
P Murugavel et al 2008 J. Phys.: Condens. Matter 20 415208
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