M M J Treacy et al 2007 J. Phys.: Condens. Matter 19 455201 doi:10.1088/0953-8984/19/45/455201
M M J Treacy1, D Kumar1, A Rougée1,5, G Zhao2, P R Buseck2,3, I McNulty4, L Fan4,6, C Rau4,7 and J M Gibson4
Show affiliationsWe outline recent advances in the fluctuation microscopy technique for probing medium-range structural correlations in disordered materials. The technique was originally developed for electron microscopy, but has now been extended to optical and x-ray microscopies.
We show that fluctuation microscopy can detect trace quantities of C60 in a disordered graphite matrix, even though the diffraction signature from the C60 is essentially undetectable. This result indicates that the technique can be used to discern dilute distributions of macromolecules in an otherwise disordered matrix.
We also report preliminary studies of interferometric fluctuation microscopy using cross-correlations in diffraction between coherent double probes. This is a form of holography where the diffraction patterns from two neighboring regions are allowed to overlap and interfere. Young's fringes appear wherever both regions scatter strongly. The cross-correlation can be examined as a function of probe separation to estimate a structure correlation length. This method holds much promise for studying medium-range order, since it isolates the essential four-body terms underpinning the fluctuation microscopy technique.
61.48.-c Structure of fullerenes and related hollow molecular clusters
68.37.Hk Scanning electron microscopy (SEM) (including EBIC)
Issue 45 (14 November 2007)
Received 23 July 2007, in final form 24 July 2007
Published 24 October 2007
M M J Treacy et al 2007 J. Phys.: Condens. Matter 19 455201
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