J Feng et al 2005 J. Phys.: Condens. Matter 17 S1339 doi:10.1088/0953-8984/17/16/005
J Feng1, E Forest2, A A MacDowell1, M Marcus1, H Padmore1, S Raoux3, D Robin1, A Scholl1, R Schlueter1, P Schmid1, J Stöhr4, W Wan1, D H Wei5 and Y Wu6
Show affiliationsA new ultrahigh-resolution photoemission electron microscope called PEEM3 is being developed at the advanced light source (ALS). An electron mirror combined with a sophisticated magnetic beam separator is used to provide simultaneous correction of spherical and chromatic aberrations. Installed on an elliptically polarized undulator beamline, PEEM3 will be operated with very high spatial resolution and high flux to study the composition, structure, electric and magnetic properties of complex materials.
68.37.Xy Scanning Auger microscopy, photoelectron microscopy
Accelerators, beams and electromagnetism
Issue 16 (27 April 2005)
Received 9 December 2004, in final form 9 December 2004
Published 8 April 2005
J Feng et al 2005 J. Phys.: Condens. Matter 17 S1339
David Akkurt et al 2009 J. Neural Eng. 6 056004
Thomas J. J. Kehoe et al. 2003 The Astronomical Journal 126 3108
R. C. Brüns et al. 2009 ApJ 702 1268
J. M. Torrelles et al 2003 ApJ 598 L115
Krzysztof Z. Kamiński et al. 2007 The Astronomical Journal 134 1206
Fronefield Crawford et al. 2001 The Astronomical Journal 122 2001
D. Gouliermis et al 2006 ApJ 636 L133
A. P. Sarma and E. Momjian 2009 ApJ 705 L176
Timothy M. Brown 2003 ApJ 593 L125