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Measurements of composite fermion conductivity dependence on carrier density

C-T Liang1,4, M Y Simmons2,3, D A Ritchie2 and M Pepper2

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We present the first experimental study of the carrier density dependence of the composite fermion conductivity σxxCF at Landau level filling factors ν = 1/2 and 3/2 in high-quality front-gated GaAs/Al0.33Ga0.67As heterostructures. Extracting α from the power law \ln (\sigma^{{\mathrm {CF}}}_{xx}) \propto \ln (n_{\mathrm {e}})^{\alpha } shows that \alpha \approx 1 . The measured {\alpha } \approx 1 is placed between the predicted value 3/4 in the strong random magnetic field regime, and 3/2 in the weak random magnetic field regime. Comparisons between our results and theory are discussed.


PACS

71.10.Pm Fermions in reduced dimensions (anyons, composite fermions, Luttinger liquid, etc.)

73.40.Kp III-V semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions

73.43.Qt Magnetoresistance

71.70.Di Landau levels

Subjects

Condensed matter: electrical, magnetic and optical

Semiconductors

Surfaces, interfaces and thin films

Dates

Issue 7 (25 February 2004)

Received 20 November 2003

Published 6 February 2004



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