Hyunjung Kim et al 2004 J. Phys.: Condens. Matter 16 S3491 doi:10.1088/0953-8984/16/33/010
Hyunjung Kim1, A Rühm2,9, L B Lurio3, J K Basu4,10, J Lal5, S G J Mochrie6 and S K Sinha7,8
Show affiliationsX-ray photon correlation spectroscopy, an emerging technique for studying the slow dynamics of condensed matter, has been employed to probe surface fluctuations on thin supported polymer films as a function of in-plane wavevector, film thickness, temperature, and molecular weight of the polymer. The measurements were performed on thin polystyrene (PS) films of thicknesses ranging from 84 to 333 nm above the glass transition temperature. The lateral length scales probed are at least ten times smaller than those accessible in conventional dynamic light scattering. We find excellent agreement between the measured surface dynamics and the theory of overdamped thermal capillary waves on thin viscoelastic films. The values of the viscosity obtained from these data show good agreement with those of bulk PS.
68.55.-a Thin film structure and morphology
61.41.+e Polymers, elastomers, and plastics
78.35.+c Brillouin and Rayleigh scattering; other light scattering
Soft matter, liquids and polymers
Issue 33 (25 August 2004)
Received 22 April 2004
Published 6 August 2004
Hyunjung Kim et al 2004 J. Phys.: Condens. Matter 16 S3491
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