Chiara Neto et al 2003 J. Phys.: Condens. Matter 15 S421 doi:10.1088/0953-8984/15/1/358
Correlated dewetting patterns in thin polystyrene films
Chiara Neto1, Karin Jacobs1,4, Ralf Seemann1, Ralf Blossey2, Jürgen Becker3 and Günther Grün3
Show affiliationsWe describe preliminary results of experiments and simulations concerned with the dewetting of thin polystyrene films (thickness < 7 nm) on top of silicon oxide wafers. In the experiments we scratched an initially flat film with an atomic force microscopy (AFM) tip, producing dry channels in the film. Dewetting of the films was imaged in situ using AFM and a correlated pattern of holes ('satellite holes') was observed along the rims bordering the channels. The development of this complex film rupture process was simulated and the results of experiments and simulations are in good agreement. On the basis of these results, we attempt to explain the appearance of satellite holes and their positions relative to pre-existing holes.
- PACS
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68.55.-a Thin film structure and morphology
62.20.M- Structural failure of materials
81.40.Np Fatigue, corrosion fatigue, embrittlement, cracking, fracture, and failure
- Subjects
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Soft matter, liquids and polymers
- Dates
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Issue 1 (15 January 2003)
Received 24 October 2002
Published 16 December 2002
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Correlated dewetting patterns in thin polystyrene films
Chiara Neto et al 2003 J. Phys.: Condens. Matter 15 S421
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