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Characterization of the transient thermal-lens effect using top-hat beam Z-scan

Junyi Yang1, Yuxiao Wang2, Xueru Zhang2, Changwei Li2, Xiao Jin2, Min Shui2 and Yinglin Song1

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The transient thermal-lens effect in a solution is investigated by using the top-hat beam Z-scan technique. The numerical results show that the sensitivity of the top-hat beam Z-scan measurements is about 3.5 times greater than the Gaussian beams for the transient thermal-lens effect when the phase shift is small, which is greater than that for the Kerr effect and the steady-state thermal-lens effect. The reasons are also discussed in detail.


PACS

78.20.Nv Thermooptical and photothermal effects

78.20.Ci Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)

42.65.Hw Phase conjugation; photorefractive and Kerr effects

Subjects

Condensed matter: electrical, magnetic and optical

Optics, quantum optics and lasers

Dates

Issue 22 (28 November 2009)

Received 20 May 2009, in final form 22 September 2009

Published 30 October 2009



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