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Multiple ionization of atomic argon irradiated by EUV free-electron laser pulses at 62 nm: evidence of sequential electron strip

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K Motomura1,2, H Fukuzawa1,2, L Foucar1,2,3, X-J Liu1,2, G Prümper1,2, K Ueda1,2, N Saito2,4, H Iwayama2,5, K Nagaya2,5, H Murakami2,5, M Yao2,5, A Belkacem6, M Nagasono2, A Higashiya2, M Yabashi2, T Ishikawa2, H Ohashi2,7 and H Kimura2,7

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We have investigated multiple ionization of atomic argon by extreme-ultraviolet light pulses (62 nm, 100 fs in width, <2 × 1014 W cm−2) at the free-electron laser facility in Japan, and observed highly charged ions with the charge state up to +6. The measured laser power dependence of the highly charged ions indicates that the multiple ionization proceeds via the sequential stripping of electrons.


PACS

32.80.Fb Photoionization of atoms and ions

32.10.Bi Atomic masses, mass spectra, abundances, and isotopes

41.60.Cr Free-electron lasers

Subjects

Atomic and molecular physics

Accelerators, beams and electromagnetism

Dates

Issue 22 (28 November 2009)

Received 17 September 2009

Published 5 November 2009



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