Ataru Kobayashi et al 2002 J. Phys. B: At. Mol. Opt. Phys. 35 2087 doi:10.1088/0953-4075/35/9/307
Ataru Kobayashi1, Goro Fujiki, Atsuo Okaji and Toshio Masuoka
Show affiliationsElectron impact multiple ionization relative cross sections of rare gas atoms (Ne, Ar, Kr and Xe) have been measured using a pulsed electron beam and a pulsed ion extraction combined with a time-of-flight analysis of the charge. The measurements cover a larger range of energies and charges than in earlier experiments, from threshold to 1 keV and from charge n = 1 to 4 (Ne), 5 (Ar), 7 (Kr) and 6 (Xe). The average number (γ) of electrons ejected from the atom per ionization event is calculated and used to evaluate the contributions of the inner-shell processes. The results are also compared with those in the case of photon impact. As regards the major ions produced, relative uncertainty as low as 1.3% for the ionization cross section ratios is achieved for all the sample gases, except near threshold. As for the γ-values, relative uncertainty is estimated to be as low as 1.2%.
Issue 9 (14 May 2002)
Received 16 November 2001, in final form 7 February 2002
Published 24 April 2002
Ataru Kobayashi et al 2002 J. Phys. B: At. Mol. Opt. Phys. 35 2087
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