Alex B Borisov et al 2002 J. Phys. B: At. Mol. Opt. Phys. 35 L461 doi:10.1088/0953-4075/35/21/101
Ultraviolet–infrared wavelength scalings for strong field induced L-shell emissions from Kr and Xe clusters
FREE ARTICLEAlex B Borisov1, Xiangyang Song1, Fabrizio Frigeni2, Yang Dai3, Yevgeniya Koshman3, W Andreas Schroeder1, Jack Davis4, Keith Boyer1 and Charles K Rhodes1,2,3,5
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Comparison of Xe(L)/Kr(L) emission spectra generated from Xe and Kr clusters by ultraviolet (248 nm) and infrared (800/1060 nm) excitation reveals sharply different wavelength scalings. An interpretation of these contrasting scalings based on L-shell Auger widths explains this difference and supports the theoretical attribution of the strong hollow-atom Xe(L) emission produced with 248 nm irradiation to an ordered phase-dependent coupling. These results indicate that clusters of Yb, Ta and W may produce comparably strong hollow atom L-shell emission at ~8 keV with 248 nm excitation.
- PACS
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36.40.Vz Optical properties of clusters
33.80.Eh Autoionization, photoionization, and photodetachment
- Subjects
- Dates
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Issue 21 (14 November 2002)
Received 13 May 2002, in final form 23 September 2002
Published 29 October 2002
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Ultraviolet–infrared wavelength scalings for strong field induced L-shell emissions from Kr and Xe clusters
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