S Urazhdin et al 2004 Supercond. Sci. Technol. 17 88 doi:10.1088/0953-2048/17/1/015
S Urazhdin1, W K Neils2, S H Tessmer1, Norman O Birge1 and D J Van Harlingen2
Show affiliationsWe report the results of a cryogenic study of the modification of YBa2Cu3O7−δ surface electronic properties with the probe of a scanning tunnelling microscope (STM). A negative voltage applied to the sample during STM tunnelling is found to modify locally the conductance of the native degraded surface layer. When the degraded layer is removed by etching, the effect disappears. An additional surface effect is identified using scanning Kelvin probe microscopy in combination with STM. We observe reversible surface charging for both etched and unetched samples, indicating the presence of a defect layer even on a surface never exposed to air.
81.65.Cf Surface cleaning, etching, patterning
68.37.Ef Scanning tunneling microscopy (including chemistry induced with STM)
74.25.Nf Response to electromagnetic fields (nuclear magnetic resonance, surface impedance, etc.)
74.25.Fy Transport properties (electric and thermal conductivity, thermoelectric effects, etc.)
Issue 1 (January 2004)
Received 14 July 2003, in final form 4 September 2003
Published 19 November 2003
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