Z Hao et al 2000 Supercond. Sci. Technol. 13 612 doi:10.1088/0953-2048/13/5/334
Z Hao1, B T Liu, Y Lin, B Xu, F Wu, H J Tao, B Y Zhu, Z X Zhao, B R Zhao, Z Hao, B T Liu, Y Lin, B Xu, F Wu, H J Tao, B Y Zhu and Z X Zhao
Show affiliationsVery smooth epitaxial Pb(Zr0.53Ti0.47)O3/YBa2Cu3O7-δ heterostructures have been fabricated on (100) SrTiO3 substrates by magnetron sputtering. The smooth YBCO (yttrium-barium-copper oxide) bottom layer is a-axis oriented, with low roughness of ~1.7 nm in a randomly selected 10 µm×10 µm area. Highly c-axis-oriented PZT (Pb(Zr, Ti)O3) films were grown on the YBCO layer, with average roughness of ~1.6 nm. However, when the deposition temperature is increased, the grain size of the PZT films increases from ~0.1 µm to ~0.3 µm, and the roughness increases too. Large-area ferroelectricity was investigated for such heterostructures, and it is found that as the deposition temperature was increased, both the saturation polarization and the depolarization were enhanced, while the remanent polarization and coercive field were decreased. Further study on the depolarization induced by interfacial effects was carried out as well.
74.78.Fk Multilayers, superlattices, heterostructures
81.15.Cd Deposition by sputtering
74.25.Fy Transport properties (electric and thermal conductivity, thermoelectric effects, etc.)
Issue 5 (May 2000)
Received 20 January 2000
Z Hao et al 2000 Supercond. Sci. Technol. 13 612
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