A Oral et al 1997 Supercond. Sci. Technol. 10 17 doi:10.1088/0953-2048/10/1/003
Microscopic measurement of penetration depth in 
thin films by scanning Hall probe microscopy
A Oral
, S J Bending, R G Humphreys
and M Henini§
We have used a low noise scanning Hall probe microscope to measure the penetration depth microscopically in a 
thin film as a function of temperature. The instrument has high magnetic field (
at 77 K) and spatial resolution (
). Magnetic field profiles of single vortices in the superconducting film have been successfully measured and the microscopic penetration depth of the superconductor has been extracted. We find surprisingly large variations in values of 
for different vortices within the scanning field.
- PACS
- Subjects
- Dates
-
Issue 1 (January 1997)
Received 10 September 1996
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Microscopic measurement of penetration depth in thin films by scanning Hall probe microscopy
A Oral et al 1997 Supercond. Sci. Technol. 10 17
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