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Microscopic measurement of penetration depth in thin films by scanning Hall probe microscopy

A Oral-+, S J Bending-+, R G Humphreys++ and M Henini§

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We have used a low noise scanning Hall probe microscope to measure the penetration depth microscopically in a thin film as a function of temperature. The instrument has high magnetic field ( at 77 K) and spatial resolution (). Magnetic field profiles of single vortices in the superconducting film have been successfully measured and the microscopic penetration depth of the superconductor has been extracted. We find surprisingly large variations in values of for different vortices within the scanning field.


PACS

74.72.Bk Y-based cuprates

74.78.Bz High-Tc films

74.25.Qt Vortex lattices, flux pinning, flux creep

Subjects

Superconductivity

Dates

Issue 1 (January 1997)

Received 10 September 1996



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