Microscopic measurement of penetration depth in  thin films by scanning Hall probe microscopy

doi:10.1088/0953-2048/10/1/003

Microscopic measurement of penetration depth in thin films by scanning Hall probe microscopy

Author

A Oral , S J Bending , R G Humphreys and M Henini ^§

Affiliations

School of Physics, University of Bath, Claverton Down, Bath BA2 7AY, UK
DRA Electronics Division, St Andrew's Road, Malvern, Worcestershire WR14 3PS, UK
^§ Department of Physics, University of Nottingham, Nottingham NG7 2RD, UK

Journal

Superconductor Science and Technology Create an alert RSS this journal

Issue

Volume 10, Number 1

Citation

A Oral et al 1997 Supercond. Sci. Technol. 10 17

doi: 10.1088/0953-2048/10/1/003

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Abstract

We have used a low noise scanning Hall probe microscope to measure the penetration depth microscopically in a thin film as a function of temperature. The instrument has high magnetic field ( at 77 K) and spatial resolution (). Magnetic field profiles of single vortices in the superconducting film have been successfully measured and the microscopic penetration depth of the superconductor has been extracted. We find surprisingly large variations in values of for different vortices within the scanning field.

PACS