T Mulvey 1964 J. Sci. Instrum. 41 61 doi:10.1088/0950-7671/41/2/401
T Mulvey
Show affiliationsThe report reviews recent developments described at a Conference of the Electron Microscopy and Analysis Group in the design of linear focusing spectrometers for the electron probe X-ray microanalyser. (A report of the discussions on quantitative analysis will be found in the British Journal of Applied Physics.) In the spectral region for which no suitable crystals are available electronic deconvolution (`unsmearing') circuits are being successfully applied to the analysis of eight elements. New instruments which combine electron microscopy, electron diffraction and electron probe analysis are also discussed.
07.78.+s Electron, positron, and ion microscopes; electron diffractometers
Issue 2 (February 1964)
T Mulvey 1964 J. Sci. Instrum. 41 61
Li Lin et al 2008 Chinese Phys. Lett. 25 667
G. L. Bullock et al 1993 Europhys. Lett. 21 357
L Sciortino et al 2009 J. Phys.: Conf. Ser. 190 012125
G. G. Fazio et al. 2004 ApJS 154 10
Patrick Rebentrost et al 2009 New J. Phys. 11 033003
Iddo Eliazar and Joseph Klafter 2008 J. Phys. A: Math. Theor. 41 122001
J Sheffield 1972 Plasma Phys. 14 783
Jakob Hansen et al JHEP11(2009)016
R Schnabel et al 2004 Class. Quantum Grav. 21 S1045