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Experimental results on hard x-ray energy emitted by a low-energy plasma focus device: a radiographic image analysis

Marcelo Zambra1,2, Patricio Silva, Cristian Pavez1,2, Denisse Pasten1,3, José Moreno1,2 and Leopoldo Soto1,2

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The PF-400J plasma focus device (400 J of energy) was studied in a similar way to a pulsed source of high-energy x-ray radiation. High-sensitivity fast-response commercial radiographic film and different metal filter array combinations were used to study the energy of the proper emitted x-ray. The effective energy of the hard x-ray radiation is studied and discussed in terms of its effective mean attenuation with the penetration distance on different metallic samples when the x-ray pulsed beam is supposed monoenergetic. These results were then used to assess the energetic properties of the pulsed radiation when different x-ray film–filter array combinations were irradiated between tens to almost 160 effective pulses of x-ray coming from the PF-400J device.


PACS

52.58.Lq Z-pinches, plasma focus and other pinch devices

52.25.Os Emission, absorption, and scattering of electromagnetic radiation

52.75.-d Plasma devices

52.70.La X-ray and gamma-ray measurements

52.59.Px Hard X-ray sources

Subjects

Instrumentation and measurement

Plasma physics

Dates

Issue 12 (December 2009)

Received 30 April 2009, in final form 25 September 2009

Published 29 October 2009



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