Quick search Find article
Quick search
Find article

Critical exponent of the localization length for the symplectic case

Alexander Moroz

Show affiliations


A new summability method was tested to calculate the critical exponent of the localization length for the symplectic case derived from the nonlinear -model. Although we used the same series as Hikami and others, unlike them we were able to resum the series in two dimensions (2D) and obtain the result . Values of in dimensions seem to saturate the Harris inequality up to .


PACS

05.70.Jk Critical point phenomena

71.23.-k Electronic structure of disordered solids

02.30.Lt Sequences, series, and summability

MSC

82B80 Numerical methods (Monte Carlo, series resummation, etc.) (See also 65-XX, 81T80)

82B27 Critical phenomena

40Gxx Special methods of summability

Subjects

Mathematical physics

Condensed matter: electrical, magnetic and optical

Statistical physics and nonlinear systems

Dates

Issue 2 (21 January 1996)

Received 17 July 1995, in final form 13 October 1995



  1. Critical exponent of the localization length for the symplectic case

    Alexander Moroz 1996 J. Phys. A: Math. Gen. 29 289

  2. Diffusion-limited coalescence with finite reaction rates in one dimension

    Dexin Zhong and D Ben-Avraham 1995 J. Phys. A: Math. Gen. 28 33

  3. Pattern transfer fidelity of nanoimprint lithography on six-inch wafers

    Mingtao Li et al 2003 Nanotechnology 14 33

  4. Canonical expansion of -symmetric operators and perturbation theory

    E Caliceti and S Graffi 2004 J. Phys. A: Math. Gen. 37 2239

  5. The physics of electrostatic precipitation

    H J Lowe and D H Lucas 1953 Br. J. Appl. Phys. 4 S40

  6. Metal-insulator type nano-granular magnetic thin films -soft magnetic properties, TMR effect and their applications-

    S Ohnuma et al 2009 J. Phys.: Conf. Ser. 191 012020

  7. Theoretical half-life for beta decay of 96Zr

    H Heiskanen et al 2007 J. Phys. G: Nucl. Part. Phys. 34 837

  8. Multi-valued analogue information storage using self-assembled nanoparticle films

    Yoshinori Suganuma et al 2005 Nanotechnology 16 1196

  9. The elusive memristor: properties of basic electrical circuits

    Yogesh N Joglekar and Stephen J Wolf 2009 Eur. J. Phys. 30 661

  10. Departures from CLTE composition in a nitrogen arc at atmospheric pressure. II. Interpretation of departures from CLTE

    J Bacri and M Lagreca 1983 J. Phys. D: Appl. Phys. 16 841

View by subject




Export






Please login to access our web services, or create an account if you don't yet have one.

You must have cookies enabled in your web browser to be able to login.

Username
Password

Forgotten your password? Get a new one here.