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Biaxiality and temperature dependence of 3- and 4-layer intermediate smectic-phase structures as revealed by resonant X-ray scattering

N. W. Roberts1, S. Jaradat1, L. S. Hirst1,2, M. S. Thurlow1, Y. Wang1, S. T. Wang3, Z. Q. Liu3, C. C. Huang3, J. Bai4, R. Pindak4 and H. F. Gleeson1

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High-resolution resonant X-ray diffraction experiments have been performed on free-standing films of two selenium-containing antiferroelectric liquid-crystal mixtures. Optical studies had indicated that both mixtures exhibit exceptionally wide intermediate phases, over a total range of > 9 K. Through the structural information obtained from the resonant scattering data, we confirm that the intermediate phases of these mixtures show both 3-layer and 4-layer structural periodicities. Moreover, due to the stability of these phases, we report for the first time the temperature dependence of both the helicoidal pitch and distortion angle in the 3-layer phases deduced using the resonant X-ray technique. Analysis using an extension of the theory set out by Levelut and Pansu (Levelut A-M. and Pansu B., Phys. Rev. E, 60 (1999) 6803) shows that over the temperature ranges measured, the pitch changes linearly as a function of temperature whilst the distortion angle remains constant.


PACS

78.70.Ck X-ray scattering

83.80.Xz Liquid crystals: nematic, cholesteric, smectic, discotic, etc.

61.30.Eb Experimental determinations of smectic, nematic, cholesteric, and other structures

Subjects

Soft matter, liquids and polymers

Fluid dynamics

Condensed matter: electrical, magnetic and optical

Dates

Issue 6 (December 2005)

Received 19 August 2005, accepted for publication 19 October 2005, in final form 19 October 2005

Published 23 November 2005



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