G L J A Rikken et al 1988 Semicond. Sci. Technol. 3 302 doi:10.1088/0268-1242/3/4/005
G L J A Rikken, P Wyder, J M Chamberlain, R T Grimes and D P Halliday
Show affiliationsThe authors have obtained evidence from galvanomagnetic and PL measurements that the electron mobility compensation ratio relationship of Taguchi and Yamada (1987) provides more realistic values of NA/ND than Walukiewicz and co-workers earlier relationship (1980). They also point out the possible use of FIR photosignal decay measurements as a means of determining NA and ND, particularly in the difficult case of low-compensation materials.
72.20.Fr Low-field transport and mobility; piezoresistance
Issue 4 (April 1988)
G L J A Rikken et al 1988 Semicond. Sci. Technol. 3 302
José P P Domingues et al 1997 Meas. Sci. Technol. 8 322
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