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Nitrogen-implanted Ge2Sb2Te5 film used as multilevel storage media for phase change random access memory

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Bo Liu1, Ting Zhang1, Jilin Xia1, Zhitang Song1,2, Songlin Feng2 and Bomy Chen3

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[1]

Multi-State Data Storage of Ge2Sb2Te5∕Ga30Sb70 Multilayer Films for Phase Change Memory

Mingcheng Sun et al  Electrochemical and Solid-State Letters 2012  15 H115
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[2]

Properties of Phase Change Materials Modified by Ion Implantation

Simone Raoux et al  MRS Proceedings 2011  1338 mrss11-1338-r05-06
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N-doped Sb2Te phase change materials for higher data retention

Min Zhu et al  Journal of Alloys and Compounds 2011 
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Sb-rich Si-Sb-Te phase change material for multilevel data storage: The degree of disorder in the crystalline state

Xilin Zhou et al  Applied Physics Letters 2011  99 032105
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Ga[sub 2]Te[sub 3] phase change material for low-power phase change memory application

Hao Zhu et al  Applied Physics Letters 2010  97 083504
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Performance improvement of phase change memory cell by using a cerium dioxide buffer layer

Fei Shang et al  Applied Physics Letters 2010  96 203504
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Ge2Sb2Te5 Phase Change Memory Cell Featuring Platinum Tapered Heating Electrode For Low-Voltage Operation

Shilong Lv et al  Japanese Journal of Applied Physics 2010  49 026503
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Binary semiconductor In2Te3 for the application of phase-change memory device

Hao Zhu et al  Journal of Materials Science 2010 
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H.-S. Philip Wong et al  Proceedings of the IEEE 2010  98 2201
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Improved Performance of Phase Change Memory Cell with Strontium Titanate and Barium Titanate Buffer Layer

Fei Shang et al  Japanese Journal of Applied Physics 2010  49 094202
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Three-Dimensional Finite Element Analysis of Phase Change Memory Cell with Thin TiO2 Film

Liu Yan et al  Chinese Physics Letters 2010  27 038502
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[12]

Si2Sb2Te6 Phase Change Material for Low-Power Phase Change Memory Application

Xilin Zhou et al  Applied Physics Express 2009  2 091401
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Ga2Te3Sb5-A Candidate for Fast and Ultralong Retention Phase-Change Memory

Kin-Fu Kao et al  Advanced Materials 2009  NA
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[14]

EVALUATION OF DIFFERENT METALORGANIC PRECURSORS FOR Ge-Sb-Te THIN FILM DEPOSITION

DENIS RESO et al  Integrated Ferroelectrics 2009  110 87
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[15]

Performance improvement of phase-change memory cell with cup-shaped bottom electrode contact

W. L. Liu et al  Applied Physics Letters 2008  93 103107
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[16]

Effect of Nitrogen Implantation with Low Dose on Thermomechanical Properties and Microstructure of Ge2Sb2Te5 Films

Yong Tae Kim et al  Japanese Journal of Applied Physics 2008  47 1491
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[17]

Lower current operation of phase change memory cell with a thin TiO[sub 2] layer

Songlin Feng et al  Applied Physics Letters 2008  92 062103
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[18]

Characterization of RF magnetron sputtered Se-doped Ge2Sb2.3Te5 thin films

Tomas Wagner et al  MRS Proceedings 2008  1072 1072-G05-07
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[19]

Investigation of environmental friendly Te-free SiSb material for applications of phase-change memory

Ting Zhang et al  Semiconductor Science and Technology 2008  23 055010
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[20]

Switching Characteristics of Phase Change Memory Cell Integrated with Metal-Oxide Semiconductor Field Effect Transistor

Xu Cheng et al  Chinese Physics Letters 2008  25 1848
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High Speed and Ultra-Low-Power Phase Change Line Cell Memory Based on SiSb Thin Films with Nanoscale Gap of Electrodes Less Than 100 nm

Lv Shi-Long et al  Chinese Physics Letters 2008  25 4174
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Germanium Nitride Interfacial Layer for Chalcogenide Random Access Memory Applications

Songlin Feng et al  Applied Physics Express 2007  1 011201
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Investigation of Compositional Gradient Phase Change SixSb2Te3 Thin Films

Songlin Feng et al  Japanese Journal of Applied Physics 2007  46 L70
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[24]

Multilevel Data Storage Characteristics of Phase Change Memory Cell with Doublelayer Chalcogenide Films (Ge2Sb2Te5 and Sb2Te3)

Songlin Feng et al  Japanese Journal of Applied Physics 2007  46 L25
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[25]

Set and Reset Properties of Phase Change Memory Cells with Double-Layer Chalcogenide Films (Ge[sub 2]Sb[sub 2]Te[sub 5] and Sb[sub 2]Te[sub 3])

Songlin Feng et al  Journal of The Electrochemical Society 2007  154 H999
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[26]

Investigation on the stabilization of the median resistance state for phase change memory cell with doublelayer chalcogenide films

Songlin Feng et al  Applied Physics Letters 2007  91 123511
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[27]

Phase change memory cell with an upper amorphous nitride silicon germanium heating layer

Songlin Feng et al  Applied Physics Letters 2007  91 073505
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Si1Sb2Te3 phase change material for chalcogenide random access memory

Zhang Ting et al  Chinese Physics 2007  16 2475
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Remarkable Resistance Change in Plasma Oxidized TiOx/TiNx Film for Memory Application

Wu Liang-Cai et al  Chinese Physics Letters 2007  24 1103
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Chalcogenide Random Access Memory Cell with Structure of W Sub-Microtube Heater Electrode

Liu Bo et al  Chinese Physics Letters 2007  24 262
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Reversible Resistance Switching of GeTi Thin Film Used for Non-Volatile Memory

Songlin Feng et al  Japanese Journal of Applied Physics 2006  46 L1
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Crystallization and C-RAM application of Ag-doped Sb2Te3 material

Jiaqing Xu et al  Materials Science and Engineering B 2006  127 228
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Multiple-State Storage Capability of Stacked Chalcogenide Films (Si16Sb33Te51/Si4Sb45Te51/Si11Sb39Te50) for Phase Change Memory

Lai Yun-Feng et al  Chinese Physics Letters 2006  23 2516
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[34]

Effect of N-implantation on the structural and electrical characteristics of Ge2Sb2Te5 phase change film

Bo Liu et al  Thin Solid Films 2005  478 49
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[35]

Structure and sheet resistance of boron-implanted Ge2Sb2Te5 phase change film

Bo Liu et al  Materials Science and Engineering B 2005  119 125
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[36]

Wet etching of Ge2Sb2Te5 films and switching properties of resultant phase change memory cells

Huai-Yu Cheng et al  Semiconductor Science and Technology 2005  20 1111
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[37]

Electrical Properties of Ag-Doped Ge2Sb2Te5 Films Used for Phase Change Random Access Memory

Xia Ji-Lin et al  Chinese Physics Letters 2005  22 934
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[38]

Reversible Phase Change for C-RAM Nano-Cell-Element Fabricated by Focused Ion Beam Method

Liu Bo et al  Chinese Physics Letters 2005  22 758
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Single Cell Element of Chalcogenide Random Access Memory Fabricated with the Focused Ion Beam Method

Liu Bo et al  Chinese Physics Letters 2004  21 2054
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