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A combined EPR and modulated photocurrent study of native defects in Bridgman grown vanadium doped cadmium telluride: the case of the tellurium antisite

D Verstraeten1,2, C Longeaud3, A Ben Mahmoud4,5, H J von Bardeleben4, J C Launay2, O Viraphong2 and Ph C Lemaire1

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The electrical and photoconductive properties of Bridgman grown vanadium–zinc co-doped CdTe bulk crystals are strongly influenced by one native intrinsic defect previously attributed to the Te vacancy. In order to identify this defect and control its formation mechanism, a correlated electron paramagnetic resonance (EPR) and modulated photocurrent (MPC) study has been made. The results obtained allow us to attribute this defect to the TeCd antisite, a double donor. By EPR and MPC its +/2+ level position has been determined to Ec − 0.20 eV. Four other centres of minor concentrations were characterized by MPC in as-grown crystals. From the MPC results the density of states for CdTe:V materials has been determined.


PACS

61.72.Hh Indirect evidence of dislocations and other defects (resistivity, slip, creep, strains, internal friction, EPR, NMR, etc.)

72.80.Ey III-V and II-VI semiconductors

72.40.+w Photoconduction and photovoltaic effects

81.10.Fq Growth from melts; zone melting and refining

76.30.Lh Other ions and impurities

73.20.At Surface states, band structure, electron density of states

Subjects

Condensed matter: electrical, magnetic and optical

Semiconductors

Surfaces, interfaces and thin films

Condensed matter: structural, mechanical & thermal

Dates

Issue 11 (November 2003)

Received 7 April 2003, in final form 2 July 2003

Published 11 August 2003



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